From smartphones to laptops, we use a variety of devices every day that rely on integrated circuits (ICs), or chips, to function. These chips are made up of thousands of transistors and interconnects, ...

An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...

Nobody wants chips to fail in the field, but at 65 nanometers and below, sudden failure becomes a real threat. Among the most likely causes is electromigration, a problem that's affected ICs since the ...

The shift towards the 28nm node and beyond has put the spotlight back on the interconnect in semiconductor manufacturing. In chip scaling, the big problem in the interconnect is resistance-capacitance ...

Electromigration (EM) is a phenomenon that has been well researched and understood by the design community. At mature nodes, its impact on digital integrated circuits, particularly signal ...